Nitin Saxena, C. Seshadhri. Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter. SIAM Journal on Computing, 41(5):1285-1298, 2012. [doi]
@article{SaxenaS12-0,
title = {Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter},
author = {Nitin Saxena and C. Seshadhri},
year = {2012},
doi = {10.1137/10848232},
url = {http://dx.doi.org/10.1137/10848232},
researchr = {https://researchr.org/publication/SaxenaS12-0},
cites = {0},
citedby = {0},
journal = {SIAM Journal on Computing},
volume = {41},
number = {5},
pages = {1285-1298},
}