Ahmed Sayed, Hussain Al-Asaad. A New Statistical Approach for Glitch Estimation in Combinational Circuits. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1641-1644, IEEE, 2007. [doi]
@inproceedings{SayedA07,
title = {A New Statistical Approach for Glitch Estimation in Combinational Circuits},
author = {Ahmed Sayed and Hussain Al-Asaad},
year = {2007},
doi = {10.1109/ISCAS.2007.378834},
url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.2007.378834},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/SayedA07},
cites = {0},
citedby = {0},
pages = {1641-1644},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA},
publisher = {IEEE},
}