Nour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori. Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme. IEEE Trans. VLSI Syst., 27(6):1329-1342, 2019. [doi]
@article{SayedBT19,
title = {Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme},
author = {Nour Sayed and Rajendra Bishnoi and Mehdi Baradaran Tahoori},
year = {2019},
doi = {10.1109/TVLSI.2019.2903592},
url = {https://doi.org/10.1109/TVLSI.2019.2903592},
researchr = {https://researchr.org/publication/SayedBT19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {6},
pages = {1329-1342},
}