Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme

Nour Sayed, Rajendra Bishnoi, Mehdi Baradaran Tahoori. Fast and Reliable STT-MRAM Using Nonuniform and Adaptive Error Detecting and Correcting Scheme. IEEE Trans. VLSI Syst., 27(6):1329-1342, 2019. [doi]

Abstract

Abstract is missing.