Nour Sayed, Fabian Oboril, Rajendra Bishnoi, Mehdi Baradaran Tahoori. Leveraging Systematic Unidirectional Error-Detecting Codes for fast STT-MRAM cache. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.