Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits

Selahattin Sayil, Sumanth R. Yeddula, Juyu Wang. Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits. IEEE Design & Test of Computers, 30(6):89-97, 2013. [doi]

Authors

Selahattin Sayil

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Sumanth R. Yeddula

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Juyu Wang

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