Selahattin Sayil, Sumanth R. Yeddula, Juyu Wang. Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits. IEEE Design & Test of Computers, 30(6):89-97, 2013. [doi]
@article{SayilYW13,
title = {Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits},
author = {Selahattin Sayil and Sumanth R. Yeddula and Juyu Wang},
year = {2013},
doi = {10.1109/MDAT.2013.2261432},
url = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2013.2261432},
researchr = {https://researchr.org/publication/SayilYW13},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {30},
number = {6},
pages = {89-97},
}