Fault masking issue on a dependable processor using BIST under highly electromagnetic environment

Aromhack Saysanasongkham, Satoshi Fukumoto, Masayuki Arai. Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. IJCSE, 14(4):309-320, 2017. [doi]

Authors

Aromhack Saysanasongkham

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Satoshi Fukumoto

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Masayuki Arai

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