Aromhack Saysanasongkham, Satoshi Fukumoto, Masayuki Arai. Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. IJCSE, 14(4):309-320, 2017. [doi]
@article{Saysanasongkham17,
title = {Fault masking issue on a dependable processor using BIST under highly electromagnetic environment},
author = {Aromhack Saysanasongkham and Satoshi Fukumoto and Masayuki Arai},
year = {2017},
doi = {10.1504/IJCSE.2017.10005743},
url = {https://doi.org/10.1504/IJCSE.2017.10005743},
researchr = {https://researchr.org/publication/Saysanasongkham17},
cites = {0},
citedby = {0},
journal = {IJCSE},
volume = {14},
number = {4},
pages = {309-320},
}