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Aromhack Saysanasongkham, Satoshi Fukumoto, Masayuki Arai. Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. IJCSE, 14(4):309-320, 2017. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Dependable Processor by Using Built-in Self Test to Tolerate Periodical Transient Faults under Highly Electromagnetic EnvironmentAromhack Saysanasongkham, Masahiko Negishi, Masayuki Arai, Satoshi Fukumoto. prdc 2012: 127-134 [doi]
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