Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen. Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 872, IEEE Computer Society, 1998. [doi]
@inproceedings{SchanstraLGVW98,
title = {Semiconductor manufacturing process monitoring using built-in self-test for embedded memories},
author = {Ivo Schanstra and Dharmajaya Lukita and A. J. van de Goor and Kees Veelenturf and Paul J. van Wijnen},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930872abs.htm},
tags = {process monitoring, testing},
researchr = {https://researchr.org/publication/SchanstraLGVW98},
cites = {0},
citedby = {0},
pages = {872},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}