Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen. Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 872, IEEE Computer Society, 1998. [doi]
Abstract is missing.