Stefan Scharoba, Kai-Uwe Basener, Jens Bielefeldt, Hans-Werner Wiesbrock, Michael Hübner 0001. Towards Machine Learning Support for Embedded System Tests. In Francesco Leporati, Salvatore Vitabile, Amund Skavhaug, editors, 24th Euromicro Conference on Digital System Design, DSD 2021, Palermo, Spain, September 1-3, 2021. pages 166-173, IEEE, 2021. [doi]
@inproceedings{ScharobaBBWH21,
title = {Towards Machine Learning Support for Embedded System Tests},
author = {Stefan Scharoba and Kai-Uwe Basener and Jens Bielefeldt and Hans-Werner Wiesbrock and Michael Hübner 0001},
year = {2021},
doi = {10.1109/DSD53832.2021.00034},
url = {https://doi.org/10.1109/DSD53832.2021.00034},
researchr = {https://researchr.org/publication/ScharobaBBWH21},
cites = {0},
citedby = {0},
pages = {166-173},
booktitle = {24th Euromicro Conference on Digital System Design, DSD 2021, Palermo, Spain, September 1-3, 2021},
editor = {Francesco Leporati and Salvatore Vitabile and Amund Skavhaug},
publisher = {IEEE},
isbn = {978-1-6654-2703-6},
}