Stefan Scharoba, Kai-Uwe Basener, Jens Bielefeldt, Hans-Werner Wiesbrock, Michael Hübner 0001. Towards Machine Learning Support for Embedded System Tests. In Francesco Leporati, Salvatore Vitabile, Amund Skavhaug, editors, 24th Euromicro Conference on Digital System Design, DSD 2021, Palermo, Spain, September 1-3, 2021. pages 166-173, IEEE, 2021. [doi]
Abstract is missing.