Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner. High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1-6, IEEE Computer Society, 2018. [doi]
Abstract is missing.