T. Schenk, S. Mueller, U. Schroeder, R. Materlik, A. Kersch, M. Popovici, C. Adelmann, S. Van Elshocht, T. Mikolajick. Strontium doped hafnium oxide thin films: Wide process window for ferroelectric memories. In Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013. pages 260-263, IEEE, 2013. [doi]
No reviews for this publication, yet.