Rafael B. Schivittz, Denis T. Franco, Cristina Meinhardt, Paulo F. Butzen. A probabilistic model for stuck-on faults in combinational logic gates. In 17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016. pages 39-44, IEEE, 2016. [doi]
Abstract is missing.