Connecting different worlds - Technology abstraction for reliability-aware design and Test

Ulf Schlichtmann, Veit Kleeberger, Jacob A. Abraham, Adrian Evans, Christina Gimmler-Dumont, Michael Glaß, Andreas Herkersdorf, Sani R. Nassif, Norbert Wehn. Connecting different worlds - Technology abstraction for reliability-aware design and Test. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-8, IEEE, 2014. [doi]

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