Lawrence M. Schlitt, Priyank Kalla, Steve Blair. A Methodology for Thermal Characterization Abstraction of Integrated Opto-Electronic Layouts. In 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, VLSID 2016, Kolkata, India, January 4-8, 2016. pages 270-275, IEEE Computer Society, 2016. [doi]
Abstract is missing.