Edward F. Schmeichel, S. Louis Hakimi, M. Otsuka, Geoff Sullivan. On minimizing testing rounds for fault identification. In Proceedings of the Eighteenth International Symposium on Fault-Tolerant Computing, FTCS 1988, Tokyo, Japan, 27-30 June, 1988. pages 266-271, IEEE Computer Society, 1988. [doi]
Abstract is missing.