Electron Beam Probing - A Solution for MCM Test and Failure Analysis

R. Schmid, R. Schmitt, M. Brunner, O. Gessner, M. Sturm. Electron Beam Probing - A Solution for MCM Test and Failure Analysis. J. Electronic Testing, 10(1-2):55-63, 1997. [doi]

Authors

R. Schmid

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R. Schmitt

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M. Brunner

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O. Gessner

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M. Sturm

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