Electron Beam Probing - A Solution for MCM Test and Failure Analysis

R. Schmid, R. Schmitt, M. Brunner, O. Gessner, M. Sturm. Electron Beam Probing - A Solution for MCM Test and Failure Analysis. J. Electronic Testing, 10(1-2):55-63, 1997. [doi]

Abstract

Abstract is missing.