Robert Schmidt, Alberto GarcĂa Ortiz, Goerschwin Fey. Temporal redundancy latch-based architecture for soft error mitigation. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 240-243, IEEE, 2017. [doi]
Abstract is missing.