Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus. An adaptive self-test routine for in-field diagnosis of permanent faults in simple RISC cores. In Jaan Raik, Viera Stopjaková, Heinrich Theodor Vierhaus, Witold A. Pleskacz, Raimund Ubar, Helena Kruus, Maksim Jenihhin, editors, IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2012, Tallinn, Estonia, April 18-20, 2012. pages 312-317, IEEE, 2012. [doi]
Abstract is missing.