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Erkennung deformierbarer Konturen und Oberflächen in verrauschten Bilddaten durch Einsatz modellgekoppelter anisotroper Merkmalsextraktoren

Marcus Schreckenberg, G. von Dziembowski, Dietrich Meyer-Ebrecht. Erkennung deformierbarer Konturen und Oberflächen in verrauschten Bilddaten durch Einsatz modellgekoppelter anisotroper Merkmalsextraktoren. In Paul Levi, Rolf-Jürgen Ahlers, Franz May, Michael Schanz, editors, Mustererkennung 1998, 20. DAGM-Symposium, Stuttgart, 29. September - 1. Oktober 1998, Proceedings. Informatik Aktuell, pages 219-226, Springer, 1998.

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Marcus Schreckenberg

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G. von Dziembowski

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Dietrich Meyer-Ebrecht

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