Tractable probabilistic models for intention recognition based on expert knowledge

Oliver C. Schrempf, David Albrecht, Uwe D. Hanebeck. Tractable probabilistic models for intention recognition based on expert knowledge. In 2007 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 29 - November 2, 2007, Sheraton Hotel and Marina, San Diego, California, USA. pages 1429-1434, IEEE, 2007. [doi]

Authors

Oliver C. Schrempf

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David Albrecht

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Uwe D. Hanebeck

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