Oliver C. Schrempf, David Albrecht, Uwe D. Hanebeck. Tractable probabilistic models for intention recognition based on expert knowledge. In 2007 IEEE/RSJ International Conference on Intelligent Robots and Systems, October 29 - November 2, 2007, Sheraton Hotel and Marina, San Diego, California, USA. pages 1429-1434, IEEE, 2007. [doi]
Abstract is missing.