Dominique Schreurs, Servaas Vandenberghe, Geert Carchon, Bart Nauwelaers, Ewout Vandamme, Gonçal Badenes, Ludo Deferm. Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurements. In IEEE International Symposium on Circuits and Systems, ISCAS 2000, Emerging Technologies for the 21st Century, Geneva, Switzerland, 28-31 May 2000, Proceedings. pages 429-432, IEEE, 2000. [doi]
Abstract is missing.