Erik Schüler, Luigi Carro. Increasing Fault Tolerance to Multiple Upsets Using Digital Sigma-Delta Modulators. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 255-259, IEEE Computer Society, 2005. [doi]
@inproceedings{SchulerC05,
title = {Increasing Fault Tolerance to Multiple Upsets Using Digital Sigma-Delta Modulators},
author = {Erik Schüler and Luigi Carro},
year = {2005},
doi = {10.1109/IOLTS.2005.37},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2005.37},
researchr = {https://researchr.org/publication/SchulerC05},
cites = {0},
citedby = {0},
pages = {255-259},
booktitle = {11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2406-0},
}