Increasing Fault Tolerance to Multiple Upsets Using Digital Sigma-Delta Modulators

Erik Schüler, Luigi Carro. Increasing Fault Tolerance to Multiple Upsets Using Digital Sigma-Delta Modulators. In 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 6-8 July 2005, Saint Raphael, France. pages 255-259, IEEE Computer Society, 2005. [doi]

Abstract

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