Rafael B. Schvittz, Denis Teixeira Franco, Leomar S. da Rosa Jr., Paulo F. Butzen. Probabilistic Method for Reliability Estimation of SP- Networks considering Single Event Transient Faults. In 25th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2018, Bordeaux, France, December 9-12, 2018. pages 357-360, IEEE, 2018. [doi]
Abstract is missing.