Rafael B. Schvittz, Denis Teixeira Franco, Leomar Soares, Paulo Francisco Butzen. A Simplified Layout-Level method for Single Event Transient Faults Susceptibility on Logic Gates. In 27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019. pages 185-190, IEEE, 2019. [doi]
Abstract is missing.