Christian Schwabe, Xing Liu, Tobias N. Wassermann, Paul Salmen, Thomas Basler. SiC MOSFET threshold voltage stability during power cycling testing and the impact on the result interpretation. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.