A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy

Abu Sebastian, Anil Gannepalli, Murti V. Salapaka. A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy. IEEE Trans. Contr. Sys. Techn., 15(5):952-959, 2007. [doi]

Authors

Abu Sebastian

This author has not been identified. Look up 'Abu Sebastian' in Google

Anil Gannepalli

This author has not been identified. Look up 'Anil Gannepalli' in Google

Murti V. Salapaka

This author has not been identified. Look up 'Murti V. Salapaka' in Google