Abu Sebastian, Anil Gannepalli, Murti V. Salapaka. A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy. IEEE Trans. Contr. Sys. Techn., 15(5):952-959, 2007. [doi]
@article{SebastianGS07,
title = {A Review of the Systems Approach to the Analysis of Dynamic-Mode Atomic Force Microscopy},
author = {Abu Sebastian and Anil Gannepalli and Murti V. Salapaka},
year = {2007},
doi = {10.1109/TCST.2007.902959},
url = {http://dx.doi.org/10.1109/TCST.2007.902959},
researchr = {https://researchr.org/publication/SebastianGS07},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Contr. Sys. Techn.},
volume = {15},
number = {5},
pages = {952-959},
}