N. Pete Sedcole, Peter Y. K. Cheung. Within-die delay variability in 90nm FPGAs and beyond. In George A. Constantinides, Wai-Kei Mak, Phaophak Sirisuk, Theerayod Wiangtong, editors, 2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006. pages 97-104, IEEE, 2006. [doi]
@inproceedings{SedcoleC06,
title = {Within-die delay variability in 90nm FPGAs and beyond},
author = {N. Pete Sedcole and Peter Y. K. Cheung},
year = {2006},
doi = {10.1109/FPT.2006.270300},
url = {http://dx.doi.org/10.1109/FPT.2006.270300},
researchr = {https://researchr.org/publication/SedcoleC06},
cites = {0},
citedby = {0},
pages = {97-104},
booktitle = {2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006},
editor = {George A. Constantinides and Wai-Kei Mak and Phaophak Sirisuk and Theerayod Wiangtong},
publisher = {IEEE},
isbn = {0-7803-9728-2},
}