N. Pete Sedcole, Peter Y. K. Cheung. Within-die delay variability in 90nm FPGAs and beyond. In George A. Constantinides, Wai-Kei Mak, Phaophak Sirisuk, Theerayod Wiangtong, editors, 2006 IEEE International Conference on Field Programmable Technology, FPT 2006, Bangkok, Thailand, December 13-15, 2006. pages 97-104, IEEE, 2006. [doi]
Abstract is missing.