N. Pete Sedcole, Peter Y. K. Cheung. Parametric yield in FPGAs due to within-die delay variations: a quantitative analysis. In André DeHon, Mike Hutton, editors, Proceedings of the ACM/SIGDA 15th International Symposium on Field Programmable Gate Arrays, FPGA 2007, Monterey, California, USA, February 18-20, 2007. pages 178-187, ACM, 2007. [doi]
Abstract is missing.