Julie D. Segal, Sergei Bakarian, Ron Ross. Impact of Simulation Parameters on Critical Area Analysis. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 14, IEEE Computer Society, 1999. [doi]
@inproceedings{SegalBR99, title = {Impact of Simulation Parameters on Critical Area Analysis}, author = {Julie D. Segal and Sergei Bakarian and Ron Ross}, year = {1999}, url = {http://computer.org/proceedings/dft/0325/03250014abs.htm}, tags = {analysis}, researchr = {https://researchr.org/publication/SegalBR99}, cites = {0}, citedby = {0}, pages = {14}, booktitle = {14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings}, publisher = {IEEE Computer Society}, isbn = {0-7695-0325-X}, }