Julie D. Segal, Sergei Bakarian, Ron Ross. Impact of Simulation Parameters on Critical Area Analysis. In 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings. pages 14, IEEE Computer Society, 1999. [doi]
Abstract is missing.