Cross recurrence verification technique for process variation-resilient analog circuits

Ibtissem Seghaier, Mohamed H. Zaki, Sofiène Tahar. Cross recurrence verification technique for process variation-resilient analog circuits. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 1294-1297, IEEE, 2016. [doi]

Abstract

Abstract is missing.