J. A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio. Quiescent current analysis and experimentation of defective CMOS circuits. J. Electronic Testing, 3(4):337-348, 1992. [doi]
@article{SeguraCRFR92,
title = {Quiescent current analysis and experimentation of defective CMOS circuits},
author = {J. A. Segura and Víctor H. Champac and Rosa Rodríguez-Montañés and Joan Figueras and J. A. Rubio},
year = {1992},
doi = {10.1007/BF00135337},
url = {http://dx.doi.org/10.1007/BF00135337},
tags = {analysis},
researchr = {https://researchr.org/publication/SeguraCRFR92},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {3},
number = {4},
pages = {337-348},
}