Quiescent current analysis and experimentation of defective CMOS circuits

J. A. Segura, Víctor H. Champac, Rosa Rodríguez-Montañés, Joan Figueras, J. A. Rubio. Quiescent current analysis and experimentation of defective CMOS circuits. J. Electronic Testing, 3(4):337-348, 1992. [doi]

Abstract

Abstract is missing.