J. A. Segura, M. Roca, D. Mateo, A. Rubio. An approach to dynamic power consumption current testing of CMOS ICs. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 95-100, IEEE Computer Society, 1995. [doi]
Abstract is missing.