Sergio Segura, Dave Towey, Zhi Quan Zhou, T. Y. Chen. An Extended Abstract of "Metamorphic Testing: Testing the Untestable". In Vladimir Getov, Jean-Luc Gaudiot, Nariyoshi Yamai, Stelvio Cimato, J. Morris Chang, Yuuichi Teranishi, Ji-Jiang Yang, Hong Va Leong, Hossain Shahriar, Michiharu Takemoto, Dave Towey, Hiroki Takakura, Atilla Elçi, Susumu Takeuchi, Satish Puri, editors, 43rd IEEE Annual Computer Software and Applications Conference, COMPSAC 2019, Milwaukee, WI, USA, July 15-19, 2019, Volume 1. pages 209-210, IEEE, 2019. [doi]
@inproceedings{SeguraTZC19,
title = {An Extended Abstract of "Metamorphic Testing: Testing the Untestable"},
author = {Sergio Segura and Dave Towey and Zhi Quan Zhou and T. Y. Chen},
year = {2019},
doi = {10.1109/COMPSAC.2019.00037},
url = {https://doi.org/10.1109/COMPSAC.2019.00037},
researchr = {https://researchr.org/publication/SeguraTZC19},
cites = {0},
citedby = {0},
pages = {209-210},
booktitle = {43rd IEEE Annual Computer Software and Applications Conference, COMPSAC 2019, Milwaukee, WI, USA, July 15-19, 2019, Volume 1},
editor = {Vladimir Getov and Jean-Luc Gaudiot and Nariyoshi Yamai and Stelvio Cimato and J. Morris Chang and Yuuichi Teranishi and Ji-Jiang Yang and Hong Va Leong and Hossain Shahriar and Michiharu Takemoto and Dave Towey and Hiroki Takakura and Atilla Elçi and Susumu Takeuchi and Satish Puri},
publisher = {IEEE},
isbn = {978-1-7281-2607-4},
}