Sergio Segura, Dave Towey, Zhi Quan Zhou, T. Y. Chen. An Extended Abstract of "Metamorphic Testing: Testing the Untestable". In Vladimir Getov, Jean-Luc Gaudiot, Nariyoshi Yamai, Stelvio Cimato, J. Morris Chang, Yuuichi Teranishi, Ji-Jiang Yang, Hong Va Leong, Hossain Shahriar, Michiharu Takemoto, Dave Towey, Hiroki Takakura, Atilla Elçi, Susumu Takeuchi, Satish Puri, editors, 43rd IEEE Annual Computer Software and Applications Conference, COMPSAC 2019, Milwaukee, WI, USA, July 15-19, 2019, Volume 1. pages 209-210, IEEE, 2019. [doi]
Abstract is missing.