Study of low frequency noise in advanced SiGe: C heterojunction bipolar transistors

M. Seif, F. Pascal, B. Sagnes, A. Hoffmann, S. Haendler, P. Chevalier, D. Gloria. Study of low frequency noise in advanced SiGe: C heterojunction bipolar transistors. In 44th European Solid State Device Research Conference, ESSDERC 2014, Venice Lido, Italy, September 22-26, 2014. pages 373-376, IEEE, 2014. [doi]

Abstract

Abstract is missing.