Lukás Sekanina, Zdenek Vasícek, Alberto Bosio, Marcello Traiola, Paolo Rech, D. Oliveria, F. Fernandes, S. Di Carlo. Special session: How approximate computing impacts verification, test and reliability. In 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. pages 1, IEEE Computer Society, 2018. [doi]
Abstract is missing.