Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment - researchr publication authors

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Oleg Semenov, H. Sarbishaei, Manoj Sachdev. Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 427-432, IEEE Computer Society, 2005. [doi]

This author has not been identified. Look up 'Oleg Semenov' in GoogleThis author has not been identified. Look up 'H. Sarbishaei' in GoogleThis author has not been identified. Look up 'Manoj Sachdev' in Google

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