Oleg Semenov, H. Sarbishaei, Manoj Sachdev. Analysis and Design of LVTSCR-based EOS/ESD Protection Circuits for Burn-in Environment. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 427-432, IEEE Computer Society, 2005. [doi]
Abstract is missing.